Determining Electron Beam Lateral Coherence in a Scanning Electron Microscope Using Electron Diffraction

We develop and characterize scanning transmission electron microscopy (STEM) capabilities within a scanning electron microscope (SEM) to investigate the effective lateral coherence of the electron beam (e-beam) in the specimen plane.

Using single-crystalline Au flakes and a sample composed of a monolayer of graphene, we obtain high-quality selected-area electron diffraction (SAED) maps and convergent-beam electron diffraction (CBED) patterns, validating the systems ability to probe crystallographic information at an acceleration voltage of 30 keV.

Building on these capabilities, we implement a method, which is adapted from techniques traditionally used in transmission electron microscopy, to measure the degree of lateral coherence of the e-beam in the specimen plane of the SEM.

By analyzing interference between electrons with two different wave vectors separated by 0.031 per angstrom, we extract a lower limit for the degree of lateral coherence over 5% of the e-beam diameter of approximately 60%.

These coherence values are sufficient to enable quantum-coherent electron-light-matter interaction experiments in the SEM.