Coherent two-dimensional electronic spectroscopy integrated with confocal back focal plane microscopy

We introduce a setup for coherent two-dimensional electronic spectroscopy in the pump-probe reflection geometry that is integrated with a confocal back focal plane imaging microscope.

The angle-resolved capability is utilized to control pump and probe wavevectors, while real space imaging enables co-localization of the collection spots for linear and ultrafast experiments.

Compression of pulses down to 20 fs is achieved.

We demonstrate the capabilities of this approach on an exfoliated WSe$_2$ monolayer on Si/SiO$_2$.

The setup is suited to investigate excitons and exciton-polaritons in 2D Materials and their heterostructures.